Analytical Transmission Electron Microscopy in Materials Science
نویسندگان
چکیده
منابع مشابه
The future of atomic resolution electron microscopy for materials science
The field of atomic-resolution transmission electron microscopy and its application to materials science is reviewed. This technique, whose spatial resolution is now about one Angstrom, is valuable wherever nanoscale characterization of materials is needed. The history of the subject is briefly outlined, followed by a discussion of experimental techniques. Resolution-limiting factors are summar...
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With the components of cutting-edge devices becoming smaller and more complicated and their constituent materials becoming more multilayered and diversified, nanometer-order structural control has recently become indispensable. To improve the performance and reliability of manufactured products like these devices, nanometer-order evaluation technology is therefore essential. As examples, this p...
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Solid-state properties such as strain or chemical composition often leave characteristic fingerprints in the angular dependence of electron scattering. Scanning transmission electron microscopy (STEM) is dedicated to probe scattered intensity with atomic resolution, but it drastically lacks angular resolution. Here we report both a setup to exploit the explicit angular dependence of scattered i...
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The high resolution and sensitivity of electron microscopy is still a valuable tool, and for some diseases it is the gold standard in pathological diagnosis. Today the sample turnaround time for processing in the lab can be significantly reduced from days to hours by the microwave technology. In urgent clinical cases, microwaveassisted tissue processing, in combination with digital image acquis...
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Researchers have used transmission electron microscopy (TEM) to make contributions to cell biology for well over 50 years, and TEM continues to be an important technology in our field. We briefly present for the neophyte the components of a TEM-based study, beginning with sample preparation through imaging of the samples. We point out the limitations of TEM and issues to be considered during ex...
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ژورنال
عنوان ژورنال: Materials Transactions, JIM
سال: 1990
ISSN: 0916-1821,2432-471X
DOI: 10.2320/matertrans1989.31.538